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Journal of the Korean Institute of Industrial Engineers - Vol. 50 , No. 4
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2. p. 222 Anomaly Classification and Key Segment Detection in Semiconductor Manufacturing Processes Using Image-Based Siamese Networks
Jung In Kim, Chunghyup Mok, Hyeonji Kim, Jaehoon Kim, Hyoheon Ko, Jihoon Hong, Ju Yeon Yun, Jeong Hun Ko, Yeonjung Kim, Jiyoul Lee, Hyodong Ban, Seoung Bum Kim
DOI: https://doi.org/10.7232/JKIIE.2024.50.4.222

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Vol. 51, No. 1

Journal of the Korean Institute of Industrial Engineers

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